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Filtering by: Creator Michael Larkin Creator Phillip Lin

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X-Ray Reflectivity Analysis of Multilayer Structures

Description:

The purpose of this study is to characterize the nanometer-scale structure of an Al2O3- W-Ge multilayer utilizing x-ray reflectivity. Attributes such as layer thickness, density, surface, and interface roughness are determined and explained. The reasons for using this particular multilayer are also reviewed, as well as the benefits to science...

Keyword:

Volume 4

Creator:

Michael Bedzyk, Phillip Lin, and Michael Larkin

Owner:

Scholarly Digital Publishing

Date Uploaded:

07/18/2018

Date Modified:

07/18/2018

Date Created:

2007

Resource Type:

Article