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Filtering by: Creator Michael Larkin Type Work Collection Nanoscape: The Journal for Undergraduate Research in Nanoscience Resource type Article

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1. X-Ray Reflectivity Analysis of Multilayer Structures

Description:: The purpose of this study is to characterize the nanometer-scale structure of an Al2O3- W-Ge multilayer utilizing x-ray reflectivity. Attributes such as layer thickness, density, surface, and interface roughness are determined and explained. The reasons for using this particular multilayer are also reviewed, as well as the benefits to science...
Keyword:: Volume 4
Creator:: Michael Bedzyk, Phillip Lin, and Michael Larkin
Owner:: Scholarly Digital Publishing
Date Uploaded:: 07/18/2018
Date Modified:: 07/18/2018
Date Created:: 2007
Resource Type:: Article