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Filtering by: Creator Xiaochen Ren Type Work Keyword atom probe tomography Keyword low-dimensional electronic materials

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1. Atom Probe Tomography Analysis of Low-Dimensional Electronic Materials and Heterostructures

Description:: Atom probe tomography (APT) was used to analyze doping and alloying in low-dimensional electronic materials including thin film heterostructures, van der Waals materials, and colloidal quantum dots (QDs). Firstly, APT was used to reveal structure-property relationship for low-dimensional thin film semiconductors used in electronic and opto-electronic devices. APT was shown...
Keyword:: low-dimensional electronic materials, InGaN/GaN QWs, doping and alloying, atom probe tomography, and 2D materials
Subject:: Materials Science and Engineering
Creator:: Xiaochen Ren
Owner:: Scholarly Digital Publishing
Date Uploaded:: 10/12/2018
Date Modified:: 10/12/2018
Date Created:: 2017-01-01
Resource Type:: Dissertation