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Enhancing x-ray microscopy: correlation, fast scanning, and fast analysis

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X-rays have become a staple in the investigation of the natural world. The high penetration and short wavelength of X rays means extended samples can be imaged at high resolution. With the increasing brightness of synchrotron light sources as well as the development of commercial sources the continued development and application of x-ray microscopy is assured. This thesis presents developments towards improved correlative microscopy, scanning x-ray microscopy, and tomographic reconstruction techniques. The improvements to correlative microscopy come in the development of the Correlative Cryo Confocal Light Microscope housed at the Advanced Photon Source at Argonne National Lab. This microscope will integrate with the current Bionanoprobe scanning x-ray microscope to combine visible light confocal and fluorescence microscopy with x-ray ptychographic, tomographic, and fluorescence microscopy. For scanning x-ray microscopy, we quantify aberrations introduced by shifts between optics and their apertures when scanning light-weight optical components independently of heavy ones to increase scanning speed. Finally, we introduce a new approach to finding rotation centers of tomographic data which is faster and more noise tolerant than current methods. In addition, our approach is immune to dose fractionation, allowing low significance projections to be aligned, and independent of acquisition order permitting the use of non-sequential projection acquisition techniques. Together, these advances should increase speed and reduce radiation dose in x-ray microscopy while increasing interplay between x-ray microscopy and visible light microscopy.

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