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Total Tomography of III-As Nanowire Emitters: Atom Probe Tomography and X-ray Imaging of Nanowire Heterostructures

Description:

The three-dimensional (3D) nanoscale structure of III-As nanowires is correlated with optical and electronic property measurements to deconvolve the contributions of strain, composition, and crystal structure to characteristics of interest for future electronic and optoelectronic devices. Multiple advanced two-dimensional (2D) and 3D characterization techniques are employed such as atom probe...

Keyword:

synchrotron, nanowires, coherent X-rays, III-Vs, atom probe tomography, and correlative imaging

Subject:

Physics and Materials Science

Creator:

Hill, Megan Olivia

Owner:

Scholarly Digital Publishing

Language:

en

Date Uploaded:

02/01/2021

Date Created:

2020-01-01

Resource Type:

Dissertation

Alternate Identifier:

etdadmin_upload_771146 and http://dissertations.umi.com/northwestern:15331
Atom Probe Tomography Analysis of Low-Dimensional Electronic Materials and Heterostructures

Description:

Atom probe tomography (APT) was used to analyze doping and alloying in low-dimensional electronic materials including thin film heterostructures, van der Waals materials, and colloidal quantum dots (QDs). Firstly, APT was used to reveal structure-property relationship for low-dimensional thin film semiconductors used in electronic and opto-electronic devices. APT was shown...

Keyword:

low-dimensional electronic materials, InGaN/GaN QWs, doping and alloying, atom probe tomography, and 2D materials

Subject:

Materials Science and Engineering

Creator:

Xiaochen Ren

Owner:

Scholarly Digital Publishing

Date Uploaded:

10/12/2018

Date Modified:

10/12/2018

Date Created:

2017-01-01

Resource Type:

Dissertation

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Total Tomography of III-As Nanowire Emitters: Atom Probe Tomography and X-ray Imaging of Nanowire Heterostructures

Atom Probe Tomography Analysis of Low-Dimensional Electronic Materials and Heterostructures

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