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Filtering by: Keyword InGaN/GaN QWs Keyword atom probe tomography

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Atom Probe Tomography Analysis of Low-Dimensional Electronic Materials and Heterostructures

Description:

Atom probe tomography (APT) was used to analyze doping and alloying in low-dimensional electronic materials including thin film heterostructures, van der Waals materials, and colloidal quantum dots (QDs). Firstly, APT was used to reveal structure-property relationship for low-dimensional thin film semiconductors used in electronic and opto-electronic devices. APT was shown...

Keyword:

low-dimensional electronic materials, InGaN/GaN QWs, doping and alloying, atom probe tomography, and 2D materials

Subject:

Materials Science and Engineering

Creator:

Xiaochen Ren

Owner:

Scholarly Digital Publishing

Date Uploaded:

10/12/2018

Date Modified:

10/12/2018

Date Created:

2017-01-01

Resource Type:

Dissertation